Equipment <KLA-Tencor 6220   REQUEST A QUOTE: e-mail sales@gSEMI.com
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  KLA-Tencor 6220 Surfscan
KLA-Tencor 6220 Surfscan ____________ 
- Non-Patterned Surface Particle Measurement - 100wph/200mm Throughput/Wafer @ 1.2Ám - 90nm sensitivity >80% capture rate - Darkfield (Non)Patterned Inspection - From 4" to 8" wafers. - Full Calibration and Installation Services available

KLA-Tencor Surfscan Parts

 
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