Equipment < Rudolph AutoEl III Ellipsometer   REQUEST A QUOTE: e-mail sales@gSEMI.com
   
 
 
  Rudolph AutoEl III
Rudolph AutoEl III Ellipsometer
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- Film Thickness Measurement - Model 2A/4A Configuration (1983) - The system automatically calculates ellipsometric parameters, thickness, and index for up to two films on a substrate.
- 365nm & 546nm Wavelength Settings - Built-in Printer

 

 
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