KLA-Tencor 6220 Surfscan ____________ - Non-Patterned Surface Particle Measurement
- 100wph/200mm Throughput/Wafer @ 1.2µm
- 90nm sensitivity >80% capture rate
- Darkfield (Non)Patterned Inspection
- From 4" to 8" wafers.
- Full Calibration and Installation Services available |